This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2016, 7, 2088–2099, doi:10.3762/bjnano.7.199
Figure 1: The microstructure of the as-deposited Au(Fe) film. (a) High-resolution scanning electron microscop...
Figure 2: AFM micrograph of the surface of the as-deposited Au(Fe) film, four months after deposition.
Figure 3: AFM topography images of one and the same imprint produced at P = 0.2 mN (a) after indentation, aft...
Figure 4: AFM topography images of nanoimprints produced at P = 0.2 mN (a) after indentation, after annealing...
Figure 5: A three-dimensional AFM image of the indent after annealing for (a) 290 min and AFM profiles taken ...
Figure 6: Three-dimensional AFM image of the hole in the Au(Fe) film far from the indented regions after anne...
Figure 7: The simulated surface topography of the indent evolving by a surface diffusion mechanism, for diffe...
Figure 8: Schematic illustration of indent evolution with increasing annealing time: (a) before annealing, (b...
Figure 9: (a) Cross-sectional SEM image from the region indented at a high load (P = 1 mN), and (b) of the un...